Facilities Available
Structural characterisation
Optical microscope
Carl Zeiss (INVERTED): MAT 200 MOTORISED AXIO VISION 4.7.2 VERSION
Plan Achromatic objective lenses: 2.5x/5x/10x/20x/50x/100x Phase contrast objectives are 10x and 20x Eye piece: 10x Filters: Blue/Green/Yellow CCD: TWAINE CAMERA IMAGE ACQUISITION Halogen Bulb: HAL100: 12V, 100W and Bio-imaging using Fluorescence (HBO) attachments with 63x oil immersion objective MODES OF OPERATION: BF/DF/TRANSMISSION /TIC/DIC SLIDES
Olympus (UPRIGHT): BH-2
Objective lenses: 5x, 10x, 20x, 50x, 100x, CCD camera HAL100: 12V, 100W MODES OF OPERATION: BF/DF/TRANSMISSION /POLARISATION
Omni: Metagraph-1 (INVERTED)
Plan Achromatic objective lenses: 2.5x/5x/10x/20x/50x/100x
Eye piece: 10x, 16x/20x
Filters: Blue/Green/Yellow
Halogen Bulb: 6V, 12W
Stage opening diameter: 12mm/25mm
Modes of operation: BF/DF
Polishing and Etching:
Sturers dual disc grinding and polishing carried out using SiC emery sheets between 200 and 2500 grit then moved to Metatech single and double wheel variable speed for final diamond paste 0.25-1 µm polishing. Automatic polishing machine with 4 pole is also available. Ultrasonic cleaning is carried out and etchants are prepared in a Fume hood.
Abrasive wheel cutting machine and Diamond wheel cutting machine. Hot compaction facility for sample mounting using Bakelite powder.
Booking Details
Booking is not required for the department users. After working hours and holidays users should sign the register in the department office to collect the keys (must be returned after use) and outside users must take prior permission.
Faculty in-charge
Prof. Subodh Kumar (skumar@iisc.ac.in)
Prof. S.Karthikeyan (karthik@iisc.ac.in)
Dr. P.Padaikathan (padai@iisc.ac.in)
Scanning electron microscope
ESEM Quanta 200, FEI
W-Filament, low vacuum and humidity capability, Secondary E-T and Solid state backscattered electron detector, Ultra thin window EDS System (EDAX), Resolution at 20 kV:3nm in high vacuum.
Electron Probe Micro Analyzer
The JXA-8530F Electron Probe Micro Analyzer is a thermal field emission electron probe micro analyzer combining high SEM resolution with high quality composition analysis of submicron areas. The JEOL JXA-8530F instrument is equipped with 6 WDS detectors (3 for heavy elements and 3 for light elements) and an energy dispersive X-ray spectrometer (EDS). This combination can simultaneously analyse 3 elements WDS + 16 elements EDS plus collect image signals from backscatter and secondary electron detectors.
- High detection sensitivity for trace elements
- High accuracy of quantitative analysis
- High resolving power for adjacent X-ray spectra
- High accuracy of light elements analysis
Specifications:
- Detectable element range : 4Be to 92U Detectable X-ray range:
- Detectable wavelength range with WDS: 0.087 to 9.3 nm
- Detectable energy range with EDS : 20 kev
- Number of Spectrometers: 6 WDS detectors, 1 EDS
- Acc.Voltage: 1 to 30 kV (0.1 kV steps)
- Scanning Magnification: X 40 to 300.000 (W.D.11mm)
- Probe current: 1×10-12 to 5×10-7 A
- Probe Current stability: +(-)0.3%/h
- Secondary electron image resolution (SEI): 3.0 nm (WD11mm, 30 kV)
- Backscattered electron image (BEI) : Topo and composition image
Minimum Probe Size
- 40nm (10 kV, 1X 10-8 A)
- 100nm (10 kV, 1X 10-7 A)
Specimen size:
- 32 mm dia. X 25 mmH
- 36 mm dia. X 20 mmH X 4 pcs
- 25.5 mm dia X 20 mmH X 9 pcs
Booking details:
- Click Here to download user request form.
Faculty In-charge
Prof. Satyam Suwas (satyamsuwas@iisc.ac.in)
Dr. Subho Dasgupta (dasgupta@iisc.ac.in)
Dr. R.Ravi (rravi@iisc.ac.in)
Atomic Force Microscope
Specifications
- Scan head: Maximum scan range: 70micron
- Drive resolution Z: 0.21 nm and XY: 1.0 nm (based on 16 bits)
- Auto approach: 5mm, Maximum approach speed: 0.1mm/s
- Cantilevers: CONTR/NCLR (FREQUENCY: 15-300 kHz)
- Imaging Modes: Phase contrast, Force Modulation, Spreading Resistance
Scanning Tunneling Microscope
Specifications
- Scan head: Maximum scan range: 1.0micron
- Maximum Z-range: 200 nm
- Drive Resolution Z: 3 pm and XY: 15 pm
- Tip-sample approach: Stick-slip piezo motor
- Tip: Pt/ Ir wire: 0.25 mm
- Sample size: Max. 10 mm diameter
- Calibrated using: HOPG
Faculty In-charge
Prof. Ashok M. Raichur (amr@iisc.ac.in)
X-ray Diffraction Laboratory
XPERTPro, PANalytical JDX-8030, JEOL
(1) X-Pert PRO, PANalytical
Fixed tube, Cu target, secondary graphite monochromator, flat plate horizontal sample holder, X-Celerator* for faster data acquisition, X-Pert Hi-Score plus software pattern analysis and phase identification (ICDD data base).
*Usage of X-Celerator reduces the data acquisition time by ˜1/4th.
(2) JDX-8030, JEOL
Fixed tube, Cu and Fe-targets, horizontal flat plate sample holder.
Sample and quantity:
Most preferably powder, Otherwise any sample with flat surface. The powder/ bulk sample should cover ~ 15 mm x ~15 mm x ~1 mm space of the standard sample holder.
Faculty In-charge:
Prof. Rajeev Ranjan (rajeev@iisc.ac.in)
Prof. Satyam Suwas (satyamsuwas@iisc.ac.in)
Dr. G.S.Avadhani (gsa@iisc.ac.in)
(3) X-radiography
Stenoscop 9000 is a mobile medical X-ray unit equipped with a C-arm, on which an image intensifier and X-ray source are mounted. The X-ray system enables operation in one of several modes: standard radiography, high-resolution fluoroscopy, pulsed fluoroscopy, and standard fluoroscopy. Up to 50 min of continuous X-ray emission in the fluoroscopy mode allowed collection of the high-quality, distortion-free images. Voltage range is from 40 to 110 kV and current range is from 0.1 to 6 mA. The unit has dual focus.
Faculty In-charge
Prof. Govind S. Gupta (govindg@iisc.ac.in)
Atomic Force Microscope
Specifications
- Scan head: Maximum scan range: 70micron
- Drive resolution Z: 0.21 nm and XY: 1.0 nm (based on 16 bits)
- Auto approach: 5mm, Maximum approach speed: 0.1mm/s
- Cantilevers: CONTR/NCLR (FREQUENCY: 15-300 kHz)
- Imaging Modes: Phase contrast, Force Modulation, Spreading Resistance
Thermal analysis
DST
1. The METTLER-TOLEDO Differential Scanning Calorimeter (DSC 822 e ) with S TA R e software measures the difference between the heat flows from the sample and reference sides of a sensor as a function of temperature or time. Differences in heat flow arise when a sample absorbs or releases heat due to thermal effects such as melting, crystallization, chemical reactions, polymorphic transitions.
Specifications:
- Sample mass/volume: minimum of 0.5 -20mg/up to 150ul
- Temp range: Between -150°C and +70°C
- Cooling option: Liquid Nitrogen (pressurized to 20-30psi)
- Heating rate: 2—50 K/min
- Cooling rate: from 500°C to 100°C in 8min
- Resolution: 0.4µW
Soon DSC will be upgraded with...
Temperature-modulated DSC techniques (TMDSC) are widely used in thermal analysis to separate overlapping temperature-dependent and time-dependent thermal effects. Methods used up until now have overlaid the isothermal temperature or heating ramp with a (usually) sinusoidal temperature modulation of just one frequency (single frequency method).
Auto-Sampler Robot (for 32 No. of tests) and a LN 2 – Dewar capacity 240litre
2. The NETZSCH STA 409 runs under PROTEUS Software for simultaneous TG-DSC or simultaneous TG-DTA measurements. The TG sample carriers exchanged with TG-DSC or TG-DTA modes operation with top-loaded samples ensure total protection of the balance, which is on the bottom and through accurate flow of the purge and protective gases
Specifications:
- Temperature range: 25°C to 1600°C (SiC: HEATING ELEMENT)
- Heating and cooling rates: 5 K/min to 50 K/min
- Weighing range: 200 mg
TG resolution: up to 0.002mg
DSC resolution < 1 µW
Atmospheres: inert, oxidizing, reducing, static, dynamic
TG features:
- Mass changes in wt% or mg
- Automatic evaluation of mass-change steps
- Calculation of mass/temperature values
- Calculation of residual mass
- Extrapolated onset and end temperatures
- Peak temperatures of the 1st and 2nd derivative of the mass-change curve
- Automatic baseline
DSC/DTA features:
- Determination of onset, peak, inflection and end temperatures
- Automatic peak search
- Analysis of peak areas (enthalpies) with selectable baseline
- Enthalpy determination allowing for mass changes
- Comprehensive analysis of glass transitions
DT/TGA
Content coming soon.
Faculty In-charge
Prof. Ashok M. Raichur (amr@iisc.ac.in)
Prof. Praveen Ramamurthy (praveen@iisc.ac.in)
Dr. P.Padaikathan (padai@iisc.ac.in)
Mr R.J. Deshpande (rjd@iisc.ac.in)
Mechanical testing
Dynamic Mechanical Analyser
| Model | EPLEXOR 500 N |
| Load Capacity Force Range (Statical) | 500 N Provision to use 1500 N transducer |
| Dynamic Strain* | ± 1µm to ±1.5mm |
| Statical Strain | Upto 35 mm |
| Frequency Range | 0.01 to 100 Hz |
| tan ä | 0.0001 – 100 |
| Temperature Range | -150°C to 500°C (Furnace 1) Ambient to 1000°C (Furnace 2) |
| Available Clamping Devices | Compression, Tensile and 3 point bending – symmetric and asymmetric |
| Sample Dimensions | For compressive loads – Material Dependent For tensile and 3 point bending – Thickness: 2mm, Width: 5mm and Length: 45 mm |
| Materials that can be tested | Metals Composites Bulk metallic glasses Rubbers Elastomers |
*Maximum strain depends on the sample, clamping device and frequency
Depth Sensing Indentation
Hysitron Nano Indentor (located in Department of Mechanical Engineering
| Model | TI 900-Tribo Indentor |
| Load Capacity | Low load: 5 microN-10 mN High load: 10mN - 1N |
| Load resolution | 1nN |
| Displacement resolution | 0.04nm |
| Maximum Displacement capacity: | 2-3 microns |
| Modes of operation |
Quasistatic Nano Indentation Nano Scratch SPM In-situ Imaging Nano DMA High Temperature stage( upto 400°C) |
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CSM instrumented microindentation system
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| Room temperature | Diamond indenter (Vickers, spherical, Knoop) |
| High temperature(450°C) | Zircon (Vickers, Spherical) |
| Maximum load | 30 N |
| Load resolution | 100 micro N |
| Depth resolution | 0.3 nm |
Thin Film Residual Stress
| Model | KLA Tencor FLX 2320 |
| Specifications |
Measures curvature of plates and beams using laser. Heating stage upto 500°C in ambient atmospheres or under inert gas shrouding. |
| Procedure | Measure the curvature of substrate before and after the deposition and, knowing the substrate and film thickness and substrate elastic modulus, use Stoney’s equation to find the stress. |
| Statical Strain | Maximum size is 8 inches wafer. Plates, disks, beams with longest measurable length less than 8 inches dia. can also be used. |
Mechanical Testing Lab
Brochure of mechanical testing facilities
Faculty In-charge
Prof. Satyam Suwas (satyamsuwas@iisc.ac.in)
Dr. G.S. Avadhani (gsa@iisc.ac.in)
Prof. Praveen Kumar (praveenk@iisc.ac.in)
Materials Processing
Solid state processing
Content coming soon.
Liquid state processing
Content coming soon.
Particle characterization
| Particle Size Analyzer | ||
| Machine Model | Mastersizer | |
| Make | Malvern Instruments | |
| Size range | 0.05 to 900 µm | |
| Zetasizer | ||
| Machine Model | Zetasizer Nanoseries-ZEN 3690 | |
| Make | Malvern Instruments | |
| Particle Size range | 1nm to 3µm | |
| Size range for zeta potential | 5nm to 10 µm | |
| Automatic Micropore Physisorption Analyzer | ||
| (Determining surface area and pore size distribution from 3.5 to 5000 Angstroms) | ||
| Make and model | Micromeritics ASAP 2020 | |
| Analysis Gases | N2, Ar, CO2, O2, Kr, CO, Butane or any non-corrosive gas | |
| Analytical Techniques |
Single-point BET surface area, Multi-point BET surface area, Adsorption isotherm, Desorption isotherms, Langmuir surface area, BJH Mesopore volume, BJH Mesopore area, Total pore volume, deBoer t-Plot & others, MP-Method, Micropore Volume, Micropore Surface Area, Micropore Size Distribution, a s Plot, f-Ratio plot, Heat of adsorption, Freundlich & Temkin, Density Functional Theory, Reference isotherms, Horvath-Kawazoe, Dubinin-Radushkevich, Dubinin-Astakhov and Graph Overlays |
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| Operating Specifications | Surface Area Range 0.0005 m 2 /g and up Pore Diameter Range : 3.5 – 5000 Angstroms Micropore Volume: Detectable within 0.0001 cc/g |
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| Pressure Measurement Resolution: | 0 to 1 mmHg Transducer 0.000001 mmHg0 to 10 mmHg Transducer: 0.00001 mmHg0 to 1000 mmHg Transducer: 0.001 mmHg |
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| Typical Relative Pressures: | N2 / Liquid N2 : 10-7 Ar / Liquid Ar: 10-7 CO2 at 25 o C: 10-9 | |
Faculty In-charge
Mr. R.J.Despande (rjd@iisc.ac.in)
Chemical Analysis
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ICP Spectrometer
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| Model | JY 24 |
| Make | Jobin-Yvon, France, Sequential ICP Analyzer |
| Elements analyzed | can analyze ~ 72 elements in the periodic table including those such as boron, silicon etc., |
| Monochromator | HR 640 monochromator incorporating a holographic grating with 2400 grooves/mm with a linear dispersion of 0.6nm/mm |
| Instrument Resolution | 0.010 nm |
| Sample intake | About 1 ml/min Min |
| Detection Limits | Varies according to the element. Can be as low as 0.07 ppb for Mg to 20ppb for some of the rare earth elements |
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Atomic Absorption Spectrometer
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| Model | Series AA Spectrometer |
| Make | Thermo Electron Corporation |
| Elements analyzed | Common elements including base metals and alkaline earth metals |
| Range | upto 5ppm |
| Sensitivity | ~ 0.05ppm |
| High performance liquid chromatography (HPLC) from Waters (Identification, estimation and purification of macromolecules/oligomers/polymers) | |
| Pump | Model 515 |
| Column | Sunfire (TM) Reversed-phase HPLC column C18, 5 µ m (4.6 x 250 mm column), Operating range – pH: 2-8, columns stable upto 6000 psi. Best for purification and impurity profile assays, (Solvents-Acetonitrile) |
| Detectors | Waters 2414 (RI Detector), Waters 2489 (UV/Vis Detector) |
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Size exclusion chromatography (GPC/SEC) from Waters (For macromolecules/polymers molecular weight distribution analysis)
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| Pump | Model 515 |
| Column | Styragel HT 6E THF (7.8 x 300 mm), measuring MW range from 5000-107. Equipped with Waters temperature control module II, working range from ambient to high temperature (140°C) analysis (Solvents-TCB, THF). |
| Detectors | Waters 2414 (RI Detector). |
Faculty in-charge
Prof. A.M.Raichur (amr@iisc.ac.in)
Prof. P.C.Ramamurthy (praveen@iisc.ac.in)
Dr. P.Padaikathan (padai@iisc.ac.in)
Mr R.J.Deshpande (rjd@iisc.ac.in)
Electrical behaviour
Content coming soon.
Heat treatment
Hot air ovens
- 200 deg. C – 3 racks
- 250 deg. C – 3 racks
Tube furnaces
- Two small tube furnaces- 80 mm dia – 1050 deg. C
- One tube furnace – 50 mm dia-1300 deg C
- One tube furnace – 100 mm dia 1700 deg. C
Box furnaces
- One box furnace – chamber size 6″x1.5′- 1100 deg. C
- One box furnace- chamber size 6″x1″- 1350 deg C
- One box furnace – chamber size 6″x6″ – 1700 deg. C
Note:
For temperature precision to better than 5 deg. C, you need to take additional steps for calibration. If you want to heat below 300 deg.C, you can find first the difference between the actual and set temperatures by using a thermometer, which can go up to 250 deg. C. These thermometers are available in stores or local companies. Relatively high temperature furnaces should be calibrated with the help of melting point of gold (ask any PhD students in Prof. Aloke Paul’s lab for help). Note that this procedure is relatively more reliable than other methods.
For reliable results, perform your own calibration, especially after changing the tube or thermocouple. For one set of experiments use the same furnace to minimise errors. It is very difficult to calibrate 1700 deg. C furnace running in air. However, we have seen that above 1500 deg. C, furnaces are reliable even without any additional calibration.
Computation
The department has several computing clusters available, with contributions from the groups of Prof. T. A. Abinandanan, Prof. S. Karthikeyan, Prof. Abhik Choudhury, and Prof. Sai Gautam Gopalakrishnan. All computing clusters are located in a centralised facility in the E-wing of the department.