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Materials Facilities Center
TA Instruments DHR 3 Rheometer:
The Discovery Hybrid Rheometer is a rotational shear rheometer with a range of measurement options that include viscosity, shear stress, storage and loss modulus, strain, and phase angle. The geometries available include 40mm parallel plate, 25 and 40mm 2° cones, and cup and rotor with options of a vaned or conical rotor. It has three heating system options, peltier plate, peltier concentric cylinders, and an environmental test chamber.
Specifications:
- Torque: minimum oscillation 0.5 nN*m;
- minimum steady shear: 5 nN*m, maximum: 200 mN*m;
- Torque resolution: 0.05 nN*m;
- Frequency: 1.0E-07 to 100 Hz;
- Angular velocity: up to 300 rad/s;
- Strain step time: 15ms; Rate step time: 5ms;
- Maximum normal force: 50N;
- Normal force sensitivity: 0.005N;
- Normal force resolution: 0.5mN
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POM (OLYMPUS BX53) equipped with a (Linkam CSS450 shear stage):
Polarised Optical Microscope equipped with shear stage having the following features:
Specifications:
- Temperature range: ambient to 450°C.
- Gap setting: 5 to 2500 um
- Modes of operation: oscillatory, step and steady
- Cooling or heating rate: 0.01°C to 30°C /min
Anritsu MS4642A Vector Network Analyser:
VNA with capabilities of measuring in the broad band frequency range of 2GHz to 20GHz. It is equipped with Coaxial cable set up for measuring shielding effectiveness of donut shaped samples and wave guide setup for measuring shielding effectiveness of films up to 1mm in thickness.
Specifications:
• Fastest swept synthesized measurement speed < 20 Microsec per point
• Superior Dynamic Range - up to 140dB
• Most convenient automatic calibration system with best accuracy
TA Instruments DSC Q2000:
It is a research grade Differential Scanning Calorimeter with superior performance in baseline flatness, precision sensitivity and resolution. It is available with Modulated DSC option. It can be used for temperatures ranging from -150°C up to 600°C.
Specifications:
• Temperature Range: -80˚C to 300 ˚C
• Temperature Accuracy: +/- 0.1 ˚C
• Temperature Precision: +/- 0.01 ˚C
• Sensitivity: 0.2 µW
TA Instruments DMA Q800:
This Dynamic Mechanical Analyser uses non-contact, linear drive motor technology to provide precise control of the stress. Strain is measured using optical encoder technology that provides unmatched sensitivity and resolution.
Specifications:
- Maximum Force: 18 N; Minimum Force: 0.001 N;
- Frequency Range: 0.01 to 200 Hz;
- Dynamic Sample Deformation Range: +/- 0.5 to 10,000 µm;
- Temperature Range: -150 to 600˚C
TA Instruments TGA Q500:
It is equipped with a responsive low-mass furnace, ultrasensitive thermobalance, and efficient horizontal purge gas system with mass flow control. It has an autosampler accessory which is a programmable, multi-position sample carousel that allows fully automated analysis of up to 16 samples All aspects of sample testing are automated and software controlled.
Specifications:
• Maximum Sample Weight: 1 g
• Weighing Precision: +/- 0.01%
• Sensitivity: 0.1 µg
• Optional Temperature Range: Ambient to 800°C
• Controlled Heating Rate: 0.01 to 100°C/min
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3D printer (FabX 3.0, India)
The 3D printer used for additive manufacturing is based on the fused deposition modeling method and employed for modeling, prototyping and producing defined three dimensional structures.
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Electrospinning Instrument (ESPIN-Nano, India)
Electrospinning is used to generate polymeric fibers in the range of nanometers/ sub micrometer using polymer solution under high voltage.
JEOL JXA-8530F Electron Probe Micro analyzer
The JXA-8530F is a thermal field emission electron probe micro analyzer combining high SEM resolution with high quality composition analysis of submicron areas. The JEOL JXA-8530F instrument is equipped with 6 WDS detectors (3 for heavy elements and 3 for light elements) and an energy dispersive X-ray spectrometer (EDS). This combination can simultaneously analyse 3 elements WDS + 16 elements EDS plus collect image signals from backscatter and secondary electron detectors.
- High detection sensitivity for trace elements
- High accuracy of quantitative analysis
- High resolving power for adjacent X-ray spectra
- High accuracy of light elements analysis
Specifications:
- Detectable element range : 4Be to 92U Detectable X-ray range:
- Detectable wavelength range with WDS: 0.087 to 9.3 nm
- Detectable energy range with EDS : 20 kev
- Number of Spectrometers: 6 WDS detectors, 1 EDS
- Acc.Voltage: 1 to 30 kV (0.1 kV steps)
- Scanning Magnification: X 40 to 300.000 (W.D.11mm)
- Probe current: 1×10-12 to 5×10-7 A
- Probe Current stability: +(-)0.3%/h
- Secondary electron image resolution (SEI): 3.0 nm (WD11mm, 30 kV)
- Backscattered electron image (BEI) : Topo and composition image
Minimum Probe Size
- 40nm (10 kV, 1X 10 -8 A)
- 100nm (10 kV, 1X 10 -7 A)
Specimen size:
- 32 mm dia. X 25 mmH
- 36 mm dia. X 20 mmH X 4 pcs
- 25.5 mm dia X 20 mmH X 9 pcs
High Performance DMA GABO-EPLEXOR 500N
Available fixtures
- 3-point bending, Compression, Tension
Mode of operations
- Temperature sweep, frequency sweep, stress and strain sweep
Specifications
Temperature range(°C) -150, 500
Frequency range(Hz) 0.01,100
Load cell capacity(static +dynamic)(N) 500
Static to dynamic load ratio >1
Rigaku X-ray powder diffractometer
Specifications
- Rotating anode Cu-kalpha source, equipped with Johanssson monochromator to remove K-alpha2 component in the incident beam
TA Instruments DHR 3 Rheometer
POM (OLYMPUS BX53) equipped with a (Linkam CSS450 shear stage):
Anritsu MS4642A Vector Network Analyser
TA Instruments DSC Q2000:
TA Instruments DMA Q800:
TA Instruments TGA Q500
3D printer (FabX 3.0, India)
Electrospinning Instrument (ESPIN-Nano, India)
JEOL JXA-8530F Electron Probe Micro analyzer
High Performance DMA GABO-EPLEXOR 500N
RIGAKU_X-RAY