Scanning Electron Microscopy

Department of Materials Engineering:
ESEM Quanta 200, FEI

W-Filament, low vacuum and humidity capability,Secondary E-T and Solid state backscattered electron detector,Ultra thin window EDS System(EDAX), Resolution at 20 kV:3nm in high vacuum.

Advanced Facility for Microscopy and Microanalysisis (AFMM):
SIRION, High resolution, FEI

Schottky field emission cathode, Secondary E-T and Solid state backscattered electron detectors, TLD detector, Ultra thin window EDS system (EDAX), EBSD (TSL) and In-situ straining stage (Gatan), Resolution at 20 kV: 2 nm

ESEM Quanta 200, FEI

W-filament, low vacuum and humidity capability, Secondary E-T and Solid state backscattered electron detectors, Ultra thin window EDS system (EDAX), Resolution at 20 kV: 3 nm in high vacuum.

Quanta 200

W-filament, e-beam lithography (Nabity), Secondary E-T detector.
Booking: Download NEW USER REGISTRATION FORM, from: CLICK HERE
Booking: Click on the BUTTON below for ONLINE BOOKING ACCESS FOR MET

Faculty In-charge (Materials Engg.): V.Jayaram
Faculty In-charge (AFMM): D.Banerjee

Training for independent Usership, Obtain authorisation from supervisor, download notes from CLICK HERE FOR SEM TRAINING

Arrange to do written test at Advanced Facility for Microscopy and Microanalysis. After you pass, contact Gurulinga (Materials Engineering) or Sharath (AFMM) for hands-on training. After successfully passing training, get your booking status upgraded to independent use during normal working hours. Requests for upgradation to the Sirion at the Nanocentre and for permission to use the Materials Engg. machines at nights and weekends may be made after you have used the SEM independently for some time.